Special issue on reverse engineering and computational metrology: Part 2 - Computational metrology strategies and methods

被引：0
|
作者：
Fischer, Anath [1 ]
Levi, Raffaello
机构：
[1] Technion Israel Inst Technol, Haifa, Israel
[2] Politecn Torino, Turin, Italy
来源：
JOURNAL OF COMPUTING AND INFORMATION SCIENCE IN ENGINEERING | 2007年 / 7卷 / 01期
关键词：
D O I：
10.1115/1.2709761
中图分类号：
TP39 [计算机的应用];
学科分类号：
081203 ; 0835 ;
摘要：
引用
收藏
页码：1 / 2
页数：2
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