Electromagnetic Modeling of Electronic Device by Electrical Circuit Parameters

被引:0
|
作者
De Moura, Diego [1 ]
Raizer, Adroaldo [1 ]
机构
[1] Univ Fed Santa Catarina, Dept Elect Engn, BR-88040970 Florianopolis, SC, Brazil
关键词
Electrical circuit parameters; electromagnetic modeling; electronic device; IBIS model; internal activity; EMISSION; ELEMENT;
D O I
暂无
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
This article proposes an electric model to determine the values of the electric fields of an electronic device. When applying the method, the integrated circuit device will be modeled on the resistance, inductance and capacitance values (R, L, C parameters) provided by the IBIS (Input/Output Buffer Information Specification), also considering the internal activity of the integrated circuit. The electric parameters of the printed circuit board tracks will be extracted by software based on the moments method and fast multipole method. Simulations of the electric model are performed in the time and frequency domain by the Fourier transform, and from the obtained harmonics, the values of the electric fields are calculated with software based on the finite elements method. Measurements were performed in order to validate the simulations.
引用
收藏
页码:58 / 65
页数:8
相关论文
共 50 条
  • [41] Electromagnetic Properties of Composite Materials for the Electrical Power Device
    Lee, Sang Heon
    JOURNAL OF NANOSCIENCE AND NANOTECHNOLOGY, 2014, 14 (07) : 5455 - 5458
  • [42] EXTERNAL ELECTRICAL CIRCUIT AND ARC BEHAVIOR MODELING
    Valenta, J.
    Vavra, Z.
    XVIITH SYMPOSIUM ON PHYSICS OF SWITCHING ARC, VOL 1: CONTRIBUTED PAPERS, 2007, : 217 - 220
  • [43] Simulation Analysis of Electromagnetic Shielding of Electronic Device Chassis
    Xiao, Jia
    Song, Zhengxiang
    Wang, Jianhua
    Wang, Liang
    2019 12TH INTERNATIONAL WORKSHOP ON THE ELECTROMAGNETIC COMPATIBILITY OF INTEGRATED CIRCUITS (EMC COMPO 2019), 2019, : 91 - 93
  • [44] QUALITATIVELY MODELING THE EFFECTS OF ELECTRICAL CIRCUIT FAULTS
    LEE, MH
    ORMSBY, ART
    ARTIFICIAL INTELLIGENCE IN ENGINEERING, 1993, 8 (04): : 293 - 300
  • [45] ELECTRICAL CIRCUIT MODELING OF REVERSED FIELD PINCHES
    SPROTT, JC
    PHYSICS OF FLUIDS, 1988, 31 (08) : 2266 - 2275
  • [46] ELECTRICAL CIRCUIT MODELING OF CONDUCTORS WITH SKIN EFFECT
    KERST, DW
    SPROTT, JC
    JOURNAL OF APPLIED PHYSICS, 1986, 60 (02) : 475 - 481
  • [47] Does an electronic circuit breaker need electrical contacts?
    Meckler, P
    ELECTRICAL CONTACTS-2004: PROCEEDINGS OF THE 50TH IEEE HOLM CONFERENCE ON ELECTRICAL CONTACTS/THE 22ND INTERNATIONAL CONFERENCE ON ELECTRICAL CONTACTS, 2004, : 480 - 487
  • [48] Modeling of photodiode and measurements of device parameters
    Marincic, A
    TELSIKS 2005, PROCEEDINGS, VOLS 1 AND 2, 2005, : 291 - 294
  • [49] Modeling and parameters extraction of LDMOSFET device
    Ding, Jia-Feng
    Gu, Teng-Feng
    Li, Xin-Mei
    Li, You-Zhen
    Cao, Jian
    Deng, Hong-Gui
    SUPERLATTICES AND MICROSTRUCTURES, 2014, 66 : 76 - 84
  • [50] MODELING OF CIRCUIT-BREAKERS IN THE ELECTROMAGNETIC TRANSIENTS PROGRAM
    PHANIRAJ, V
    PHADKE, AG
    IEEE TRANSACTIONS ON POWER SYSTEMS, 1988, 3 (02) : 799 - 805