Effect of inner-shell excitation of disilane on the reaction yield of synchrotron-radiation excited high-vacuum chemical vapor deposition

被引:0
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作者
Utsumi, Y
机构
[1] NTT System Electronics Laboratories, Atsugi-shi, Kanagawa 243-01, 3-1, Morinosato Wakamiya
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D O I
10.1063/1.365928
中图分类号
O59 [应用物理学];
学科分类号
摘要
The reaction yields of synchrotron-radiation excited high-vacuum chemical vapor deposition at the core-excitation and valence-excitation regions of disilane are obtained by measuring both the incident photon numbers of the synchrotron-radiation beams which pass through C and Al filters and the rates of Si deposition induced by these synchroton-radiation beams. It is confirmed that the reaction yield for the core-excitation energy region is about three times larger than the value for the valence-excitation region. It is also demonstrated that synchrotron-radiation excited high-vacuum chemical vapor deposition proceeds by the pure-photochemical reaction, not by the reaction induced by secondary electrons due to synchrotron-radiation irradiation on the substrate. (C) 1997 American Institute of Physics.
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页码:1482 / 1484
页数:3
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