Experimental phasing with serial crystallography at XFEL and synchrotron radiation

被引：0

作者：

Yamashita, Keitaro ^{[1
]}

Hasegawa, Kazuya ^{[2
]}

Pan, Dongqing ^{[3
]}

Murai, Tomohiro ^{[3
]}

Hirata, Kunio ^{[1
]}

Ueno, Go ^{[1
]}

Nakatsu, Toru ^{[1
,3
]}

Ago, Hideo ^{[1
]}

Kumasaka, Takashi ^{[2
]}

Yamamoto, Masaki ^{[1
]}

机构：

[1] RIKEN SPring 8 Ctr, Adv Photon Technol, Sayo, Japan

[2] JASRI SPring 8, Res & Utilizat Div, Sayo, Japan

[3] Kyoto Univ, Grad Sch Pharmaceut Sci, Sakyo Ku, Kyoto, Japan

来源：

ACTA CRYSTALLOGRAPHICA A-FOUNDATION AND ADVANCES | 2016年 / 72卷

关键词：

serial crystallography; SFX; SAD; phasing; data processing;

D O I：

10.1107/S2053273316099666

中图分类号：

O6 [化学];

学科分类号：

0703 ;

摘要：

MS3-O5

引用

页码：S21 / S21

页数：1

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