Experimental phasing with serial crystallography at XFEL and synchrotron radiation

被引：0
|
作者：
Yamashita, Keitaro [1 ]
Hasegawa, Kazuya [2 ]
Pan, Dongqing [3 ]
Murai, Tomohiro [3 ]
Hirata, Kunio [1 ]
Ueno, Go [1 ]
Nakatsu, Toru [1 ,3 ]
Ago, Hideo [1 ]
Kumasaka, Takashi [2 ]
Yamamoto, Masaki [1 ]
机构：
[1] RIKEN SPring 8 Ctr, Adv Photon Technol, Sayo, Japan
[2] JASRI SPring 8, Res & Utilizat Div, Sayo, Japan
[3] Kyoto Univ, Grad Sch Pharmaceut Sci, Sakyo Ku, Kyoto, Japan
来源：
ACTA CRYSTALLOGRAPHICA A-FOUNDATION AND ADVANCES | 2016年 / 72卷
关键词：
serial crystallography; SFX; SAD; phasing; data processing;
D O I：
10.1107/S2053273316099666
中图分类号：
O6 [化学];
学科分类号：
0703 ;
摘要：
MS3-O5
引用
收藏
页码：S21 / S21
页数：1
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