Polarization state and Mueller matrix measurements in terahertz-time domain spectroscopy

被引：36
|
作者：
Dong, Hui [1 ]
Gong, Yandong [1 ]
Paulose, Varghese [1 ]
Hong, Minghui [2 ]
机构：
[1] Inst Infocomm Res, Singapore 138632, Singapore
[2] Data Storage Inst, Singapore 117608, Singapore
来源：
OPTICS COMMUNICATIONS | 2009年 / 282卷 / 18期
关键词：
Terahertz-time domain spectroscopy; Polarization state measurement; Mueller matrix measurement; ELECTROMAGNETIC-RADIATION; PHOTOCONDUCTIVE ANTENNA;
D O I：
10.1016/j.optcom.2009.06.035
中图分类号：
O43 [光学];
学科分类号：
070207 ; 0803 ;
摘要：
We derive the complete formulae governing the polarization state measurement in terahertz-time domain spectroscopy (THz-TDS) by using a rotatable THz polarizer. Four Stokes parameters can be uniquely obtained by spectrally-resolved measurement in THz-TDS. Further, we propose a new approach to measure the Mueller matrix of a pure birefringent material, using THz-TDS, by rotating the material under test. Based on the above techniques, we successfully measured the Mueller matrices of a quartz crystal in the frequency domain. (c) 2009 Elsevier B.V. All rights reserved.
引用
收藏
页码：3671 / 3675
页数：5
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