Measurement of multiple-electron emission in single field-emission events

被引：2
|
作者：
Piestrup, MA
Puthoff, HE
Ebert, PJ
机构：
[1] INST ADV STUDIES AUSTIN,AUSTIN,TX 78759
[2] NOLASCO,SCI CONSULTANTS,BATON ROUGE,LA 70808
来源：
JOURNAL OF APPLIED PHYSICS | 1997年 / 82卷 / 11期
关键词：
D O I：
10.1063/1.366462
中图分类号：
O59 [应用物理学];
学科分类号：
摘要：
Thermal and field electron emission from a modified electron microscope W source were measured with an energy-dispersive counting system. Thermal-emission spectra were consistent with random emission of single electrons, while field-emission spectra were consistent with multiple-electron emission in random events. As many as 11 electrons were detected in isolated random field-emission events. (C) 1997 American Institute of Physics.
引用
收藏
页码：5862 / 5864
页数：3
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