LIFETIME OF THE HCEI SPARK GAP SWITCH FOR LINEAR TRANSFORMER DRIVERS

被引：0

作者：

Kim, Alexander A. ^{[1
,2
]}

Mazarakis, Michael G. ^{[3
]}

Sinebryukhov, Vadim A. ^{[1
]}

Volkov, Sergey N. ^{[1
]}

Alexeenko, Vitaly M. ^{[1
]}

Kondratiev, Sergey S. ^{[1
]}

Vasiliev, Sergey V. ^{[1
]}

机构：

[1] Inst High Current Elect, 2-3 Acad Ave, Tomsk 634055, Russia

[2] Natl Res Tomsk Polytech Univ, Tomsk 634050, Russia

[3] Sandia Natl Labs, Albuquerque, NM 87185 USA

来源：

2015 IEEE PULSED POWER CONFERENCE (PPC) | 2015年

关键词：

D O I：

暂无

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

Spark gap switches, storage capacitors, and ferromagnetic cores are the most important components of the Linear Transformer Driver (LTD) cavities. Depending on their output voltage and current, LTD-based accelerators may need several thousands switches, hence the switch lifetime is of crucial importance. Unlike the capacitors and the cores, the LTD switches are still in the developmental stage and are designed and built mainly by various laboratories; thus the lifetime of different switches may vary. In this paper we present recent results of the first full-scale experiments that were aimed to evaluate the life-time of the LTD switches developed by HCEI.

引用

页数：4

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