Special Issue on International Mixed Signal Testing Workshop

被引：0

作者：

Osseiran, A

Soma, M

机构：

[1] Edith Cowan Univ, Joondalup, WA 6027, Australia

[2] Univ Washington, Seattle, WA 98195 USA

来源：

MICROELECTRONICS JOURNAL | 2002年 / 33卷 / 10期

关键词：

D O I：

10.1016/S0026-2692(02)00103-9

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

页码：771 / 772

页数：2

共 50 条

[1] Special issue on analog and mixed signal testing
Kaminska, B
Courtois, B
[J]. JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS, 1996, 9 (1-2): : 7 - 8
[2] Special issue: Mixed-signal testing
Mir, Salvador
Cheng, Tim
Richardson, Andrew
[J]. JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS, 2006, 22 (4-6): : 311 - 311
[3] Special Issue: Special Issue on the Eighth IEEE International On-Line Testing Workshop (IOLTW'02)
Agrawal, VD
[J]. JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS, 2003, 19 (05): : 495 - 495
[4] Special Issue on Analog, Mixed-Signal and RF Testing
Agrawal, Vishwani D.
[J]. JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS, 2018, 34 (03): : 209 - 209
[5] Special Issue on Analog, Mixed-Signal and RF Testing
Agrawal, Vishwani D.
[J]. JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS, 2017, 33 (03): : 275 - 275
[6] Special Issue on Analog, Mixed-Signal and RF Testing
Agrawal, Vishwani D.
[J]. JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS, 2016, 32 (04): : 399 - 399
[7] JOINT SPECIAL ISSUE ON ANALOG AND MIXED-SIGNAL TESTING - EDITORIAL
ISMAIL, M
[J]. ANALOG INTEGRATED CIRCUITS AND SIGNAL PROCESSING, 1993, 4 (03) : 195 - 195
[8] Special Issue on Analog, Mixed-Signal, RF, and MEMS Testing
Agrawal, Vishwani D.
[J]. JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS, 2012, 28 (05): : 551 - 552
[9] JOINT SPECIAL ISSUE ON ANALOG AND MIXED-SIGNAL TESTING - INTRODUCTION
SOMA, M
[J]. ANALOG INTEGRATED CIRCUITS AND SIGNAL PROCESSING, 1993, 4 (03) : 197 - 198
[10] Special issue on the eighth IEEE International On-line Testing Workshop ( IOLTW'02)
Metra, C
Reorda, MS
[J]. JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS, 2003, 19 (05): : 499 - 499

← 1 2 3 4 5 →