Special Issue on Analog, Mixed-Signal and RF Testing

被引：0
|
作者：
Agrawal, Vishwani D. [1 ]
机构：
[1] Auburn Univ, Dept ECE, 200 Broun Hall, Auburn, AL 36849 USA
来源：
JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS | 2016年 / 32卷 / 04期
关键词：
D O I：
10.1007/s10836-016-5609-x
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
引用
收藏
页码：399 / 399
页数：1
相关论文
共 50 条
  • [1] Special Issue on Analog, Mixed-Signal and RF Testing
    Agrawal, Vishwani D.
    [J]. JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS, 2017, 33 (03): : 275 - 275
  • [2] Special Issue on Analog, Mixed-Signal and RF Testing
    Agrawal, Vishwani D.
    [J]. JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS, 2018, 34 (03): : 209 - 209
  • [3] Special Issue on Analog, Mixed-Signal, RF, and MEMS Testing
    Agrawal, Vishwani D.
    [J]. JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS, 2012, 28 (05): : 551 - 552
  • [4] Guest Editorial: Special Issue on Analog, Mixed-Signal, and RF Testing
    Huang, Ke
    Barragan, Manuel J.
    [J]. JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS, 2018, 34 (03): : 213 - 214
  • [5] Guest Editorial: Special Issue on Analog, Mixed-Signal, and RF Testing
    Ke Huang
    Manuel J. Barragan
    [J]. Journal of Electronic Testing, 2018, 34 : 213 - 214
  • [6] Guest Editorial: Special Issue on Analog, Mixed-Signal, RF, and MEMS Testing
    Hsiu-Ming (Sherman) Chang
    David C. Keezer
    [J]. Journal of Electronic Testing, 2012, 28 : 555 - 556
  • [7] Guest Editorial: Special Issue on Analog, Mixed-Signal, RF, and MEMS Testing
    Chang, Hsiu-Ming
    Keezer, David C.
    [J]. JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS, 2012, 28 (05): : 555 - 556
  • [8] JOINT SPECIAL ISSUE ON ANALOG AND MIXED-SIGNAL TESTING - INTRODUCTION
    SOMA, M
    [J]. ANALOG INTEGRATED CIRCUITS AND SIGNAL PROCESSING, 1993, 4 (03) : 197 - 198
  • [9] JOINT SPECIAL ISSUE ON ANALOG AND MIXED-SIGNAL TESTING - EDITORIAL
    ISMAIL, M
    [J]. ANALOG INTEGRATED CIRCUITS AND SIGNAL PROCESSING, 1993, 4 (03) : 195 - 195
  • [10] Special issue: Mixed-signal testing
    Mir, Salvador
    Cheng, Tim
    Richardson, Andrew
    [J]. JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS, 2006, 22 (4-6): : 311 - 311
12345