Depth measurement in a germanium strip detector

被引：28

作者：

Wulf, EA ^{[1
]}

Ampe, J

Johnson, WN

Kroeger, RA

Kurfess, JD

Phlips, BF

机构：

[1] USN, Res Lab, Washington, DC 20375 USA

[2] Praxis Inc, Alexandria, VA 22304 USA

来源：

IEEE TRANSACTIONS ON NUCLEAR SCIENCE | 2002年 / 49卷 / 04期

基金：

美国国家航空航天局;

关键词：

gamma-ray imaging; position measurement; radiation detectors; semiconductor devices; spectroscopy; time measurement;

D O I：

10.1109/TNS.2002.801526

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

We have demonstrated the ability to determine the depth of a gamma-ray interaction point over the full active volume of a thick germanium strip detector. This capability provides depth resolution of less than 0.5-mm full width half maximum (FWHM) at 122 keV in a device 11 mm thick with a 2-mm strip pitch. Fifty channels of electronics have been developed and tested with a 25 X 25 germanium orthogonal strip detectors. Experiments examining the capabilities of the system and demonstrating a simple Compton telescope using a single detector have been performed.

引用

页码：1876 / 1880

页数：5

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