Depth measurement in a germanium strip detector

被引：28
|
作者：
Wulf, EA [1 ]
Ampe, J
Johnson, WN
Kroeger, RA
Kurfess, JD
Phlips, BF
机构：
[1] USN, Res Lab, Washington, DC 20375 USA
[2] Praxis Inc, Alexandria, VA 22304 USA
来源：
IEEE TRANSACTIONS ON NUCLEAR SCIENCE | 2002年 / 49卷 / 04期
基金：
美国国家航空航天局;
关键词：
gamma-ray imaging; position measurement; radiation detectors; semiconductor devices; spectroscopy; time measurement;
D O I：
10.1109/TNS.2002.801526
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
We have demonstrated the ability to determine the depth of a gamma-ray interaction point over the full active volume of a thick germanium strip detector. This capability provides depth resolution of less than 0.5-mm full width half maximum (FWHM) at 122 keV in a device 11 mm thick with a 2-mm strip pitch. Fifty channels of electronics have been developed and tested with a 25 X 25 germanium orthogonal strip detectors. Experiments examining the capabilities of the system and demonstrating a simple Compton telescope using a single detector have been performed.
引用
收藏
页码：1876 / 1880
页数：5
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