X-ray diffractometer with ellipsoidal multilayer mirror for convergent optics

被引：1
|
作者：
Schuck, Goetz [1 ]
Iwata, Akihiko [1 ]
Konya, Takayuki [2 ]
机构：
[1] Rigaku Europe SE, D-12487 Berlin, Germany
[2] Rigaku Corp, Tokyo 1968666, Japan
来源：
ACTA CRYSTALLOGRAPHICA A-FOUNDATION AND ADVANCES | 2011年 / 67卷
关键词：
X-Ray diffractometer; convergent-beam optics; powder diffraction;
D O I：
10.1107/S0108767311082778
中图分类号：
O6 [化学];
学科分类号：
0703 ;
摘要：
MS74.P28
引用
收藏
页码：C681 / C681
页数：1
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