The general process to evaluate uncertainty in EMC measurement

被引：0
|
作者：
Tan, HF [1 ]
Liu, P [1 ]
Sha, F [1 ]
机构：
[1] No Jiaotong Univ, EMC Res Sect, Beijing 100044, Peoples R China
来源：
2002 3RD INTERNATIONAL SYMPOSIUM ON ELECTROMAGNETIC COMPATIBILITY | 2002年
关键词：
EMC measurement; uncertainty;
D O I：
10.1109/ELMAGC.2002.1177411
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
A practical process, which is used to evaluate uncertainty in EMC measurement and is easy to popularize, according to the principle of uncertainty and conditions in EMC measurement, is presented. The issue of how to treat the sensitivity coefficient of some variables, whose relation with the measurement result is not very clear, is also discussed.
引用
收藏
页码：226 / 229
页数：4
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