Quantum Mechanical Confinement in the Fin Electron-Hole Bilayer Tunnel Field-Effect Transistor

被引:6
|
作者
Padilla, Jose L. [1 ,2 ]
Alper, Cem [1 ]
Gamiz, Francisco [2 ]
Ionescu, Adrian Mihai [1 ]
机构
[1] Ecole Polytech Fed Lausanne, Nanoelect Devices Lab, CH-1015 Lausanne, Switzerland
[2] Univ Granada, Dept Elect & Tecnol Comp, E-18071 Granada, Spain
关键词
Asymmetric layouts; band-to-band tunneling (BTBT); fin electron-hole bilayer tunnel field-effect transistor (EHBTFET); quantum confinement; IMPACT; LINE; PERFORMANCE; SIMULATION; VOLTAGE; TFET;
D O I
10.1109/TED.2016.2574893
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Quantum mechanical confinement in electron-hole bilayer tunnel field-effect transistors (EHBTFETs) affects in a substantial way the band-to-band tunneling (BTBT) mechanism that constitutes their operating principle. Field-induced quantization is known to set off effective bandgap widening phenomena-with the subsequent BTBT probability reduction that it entails-and to give rise to harmful parasitic tunneling processes. Both of these effects degrade the potential steep switching behavior of bilayer TFETs. In this paper, we show that the novel FinEHBTFET proves to be a promising structure for its scalability potential and propose a solution to alleviate the impact on it of quantum confinement, as well as to suppress the parasitic tunneling processes that show up when quantization is considered. Moreover, we demonstrate for different fin materials that the utilization of asymmetric configurations delaying the formation of electron inversion layers allows us to boost ION levels.
引用
收藏
页码:3320 / 3326
页数:7
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