Bridging the gap between instruments and devices under test

被引：0
|
作者：
Beaver, Patrick [1 ]
机构：
[1] Digalog Syst, New Berlin, WI 53151 USA
来源：
EE-EVALUATION ENGINEERING | 2007年 / 46卷 / 03期
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D O I：
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中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
引用
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页码：58 / +
页数：4
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