Electromigration in the dissipative state of high-temperature superconducting bridges

被引:8
|
作者
Baumans, X. D. A. [1 ]
Fernandez-Rodriguez, A. [2 ]
Mestres, N. [2 ]
Collienne, S. [1 ]
Van de Vondel, J. [3 ]
Palau, A. [2 ]
Silhanek, A. V. [1 ]
机构
[1] Univ Liege, CESAM, Q MAT, Expt Phys Nanostruct Mat, B-4000 Sart Tilman Par Liege, Belgium
[2] CSIC, Inst Ciencia Mat Barcelona, ICMAB, Campus UAB, Bellaterra 08193, Spain
[3] Katholieke Univ Leuven, Lab Solid State Phys & Magnetism, Celestijnenlaan 200D, B-3001 Leuven, Belgium
关键词
OXYGEN; JUNCTIONS;
D O I
10.1063/1.5063797
中图分类号
O59 [应用物理学];
学科分类号
摘要
The current stimulated atomic diffusion in YBa2Cu3O7-delta superconducting bridges is investigated. A superconductor to insulator transition can be induced by the current controlled electromigration process, whereas the partial recovery of the superconducting state can be achieved by inverting the polarity of the bias. Interestingly, the temperature dependence of the current density J(EM)(T), above which atomic migration takes place, intersects the critical current density J(C)(T) at certain temperature T*. Therefore, for T < T*, the current-induced dissipative state cannot be accessed without leading to irreversible modifications of the material properties. This phenomenon could also lead to the local deterioration of high critical temperature superconducting films abruptly penetrated by thermomagnetic instabilities. Published under license by AIP Publishing.
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页数:4
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