X-ray photoelectron spectroscopy, scanning electron microscopy and optical transmittance studies of indium tin oxide and cadmium sulphide thin films for solar cells

被引：36
|
作者：
Stoev, MD [1 ]
Touskova, J [1 ]
Tousek, J [1 ]
机构：
[1] CHARLES UNIV,FAC MATH & PHYS,CR-12116 PRAGUE,CZECH REPUBLIC
来源：
THIN SOLID FILMS | 1997年 / 299卷 / 1-2期
关键词：
cadmium sulphide; indium oxide; tin oxide; X-ray photoelectron spectroscopy;
D O I：
10.1016/S0040-6090(96)09085-2
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
Thin indium tin oxide (ITO) films were deposited onto borosilicate glass by d.c. sputtering from an oxide target (91 mass% In2O3 and 9 mass% SnO2). CdS thin films suitable for solar cells were obtained by chemical bath deposition (CBD) from aqueous solutions of CdSO4 and thiourea followed by thermal annealing of the layers deposited onto the electroconductive glass. The chemical changes occurring on the surface of ITO and CdS layers, as evidenced by X-ray photoelectron spectroscopy during their preparation, are discussed. The surface topography and optical properties of ITO/glass and CdS/ITO/glass films were characterized by scanning electron microscopy and optical transmittance. (C) 1997 Elsevier Science S.A.
引用
收藏
页码：67 / 71
页数：5
相关论文
共 50 条
  • [31] X-ray photoelectron spectroscopy studies of indium-tin-oxide treated via oxygen plasma immersion ion implantation
    He, Long
    Wu, Zhonghang
    Li, Zebin
    Ou, Qiongrong
    Liang, Rongqing
    EUROPEAN PHYSICAL JOURNAL-APPLIED PHYSICS, 2013, 62 (03):
  • [32] Studies of electrochemically transformed ferritin adsorbed at tin-doped indium oxide electrodes using X-ray photoelectron spectroscopy
    Martin, KC
    Villano, SM
    McCurdy, PR
    Zapien, DC
    LANGMUIR, 2003, 19 (14) : 5808 - 5812
  • [33] Local structure study of Co-doped indium oxide and indium-tin oxide thin films using x-ray absorption spectroscopy
    Subias, Gloria
    Stankiewicz, Jolanta
    Villuendas, Francisco
    Pilar Lozano, Maria
    Garcia, Joaquin
    PHYSICAL REVIEW B, 2009, 79 (09):
  • [34] Determination of the States of Oxidation of Metals in Thin Oxide Films by X-Ray Photoelectron Spectroscopy
    N. V. Alov
    Journal of Analytical Chemistry, 2005, 60 : 431 - 435
  • [35] Determination of the states of oxidation of metals in thin oxide films by X-ray photoelectron spectroscopy
    Alov, N.V., 1600, Maik Nauka Publishing / Springer SBM (60):
  • [36] Determination of the states of oxidation of metals in thin oxide films by X-ray photoelectron spectroscopy
    Alov, NV
    JOURNAL OF ANALYTICAL CHEMISTRY, 2005, 60 (05) : 431 - 435
  • [37] Scanning Tunneling Microscopy and X-ray Photoelectron Spectroscopy Studies of Graphene Films Prepared by Sonication-Assisted Dispersion
    Polyakova , Elena Y.
    Rim, Kwang Taeg
    Eom, Daejin
    Douglass, Keith
    Opila, Robert L.
    Heinz, Tony F.
    Teplyakov, Andrew V.
    Flynn, George W.
    ACS NANO, 2011, 5 (08) : 6102 - 6108
  • [38] X-ray photoelectron spectroscopy of cadmium tin oxide ceramics in as-fired and electrochemically reduced forms
    Hashemi, Tooraj, 1600, American Ceramic Soc, Westerville, OH, United States (74):
  • [39] Graphene-Capped Liquid Thin Films for Electrochemical Operando X-ray Spectroscopy and Scanning Electron Microscopy
    Falling, Lorenz J.
    Mom, Rik V.
    Diaz, Luis E. Sandoval
    Nakhaie, Siamak
    Stotz, Eugen
    Ivanov, Danail
    Haevecker, Michael
    Lunkenbein, Thomas
    Knop-Gericke, Axel
    Schloegl, Robert
    Velasco-Velez, Juan-Jesus
    ACS APPLIED MATERIALS & INTERFACES, 2020, 12 (33) : 37680 - 37692
  • [40] Positron annihilation and X-ray diffraction studies on tin oxide thin films
    Prabakar, K.
    Abhaya, S.
    Krishnan, R.
    Kalavathi, S.
    Dash, S.
    Jayapandian, J.
    Amarendra, G.
    NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 2009, 267 (07): : 1167 - 1170
12345