Mitigation of Electromagnetic Field Leakage from Apertures and Enclosures using Electromagnetic Bandgap (EBG) Structures

被引:0
|
作者
Bait-Suwailam, Mohammed M. [1 ]
Ramahi, Omar M. [1 ]
机构
[1] Univ Waterloo, Dept Elect & Comp Engn, Waterloo, ON N2 3G1, Canada
关键词
PENETRATION; REDUCTION; EMI;
D O I
暂无
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
We present novel strategies to mitigate radiated emissions through apertures and enclosures using electromagnetic bandgap (EBG) structures. The proposed technique comprises loading EBG surfaces immediately around the apertures opening in order to suppress surface currents. Numerical full-wave simulations are presented to demonstrate the effectiveness of the EBG surface. In fact, by using EBG structures, more than 20-dB reduction in field leakage is achieved in the near- and far-field radiation without affecting the aperture size. The proposed technique is compared against unloaded aperture and other loaded apertures with lossy resistive sheets. A practical case study from real-world environment is discussed and the concept is validated using measurements.
引用
收藏
页码:39 / 44
页数:6
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