共 50 条
- [2] Spatial Profiling of Planar Defects in 4H-SiC Epilayers using Micro-photoluminescence Mapping SILICON CARBIDE AND RELATED MATERIALS 2008, 2009, 615-617 : 245 - 250
- [5] Photoluminescence investigation of defects created by electron bombardment of 4H-SiC SILICON CARBIDE AND RELATED MATERIALS 2006, 2007, 556-557 : 313 - 318
- [6] Investigation of in-grown dislocations in 4H-SiC epitaxial layers SILICON CARBIDE AND RELATED MATERIALS 2005, PTS 1 AND 2, 2006, 527-529 : 147 - +
- [7] Photoluminescence, cathodo-luminescence and micro-Raman spectroscopy of as-grown stacking faults in 4H-SiC PHYSICA STATUS SOLIDI C - CURRENT TOPICS IN SOLID STATE PHYSICS VOL 4, NO 4, 2007, 4 (04): : 1513 - +
- [9] UV scanning photoluminescence spectroscopy investigation of 6H-and 4H-SiC SILICON CARBIDE AND RELATED MATERIALS 2001, PTS 1 AND 2, PROCEEDINGS, 2002, 389-3 : 601 - 604