Particle distribution analysis of Co-doped ZnO based dilute magnetic semiconductors

Specific particle size methodology is linked with deconvolving sedimentary and magnetic variability in different Dilute Magnetic Semiconductors (DMSs). The crystalline phase detection along with unit cell dimensions analysis is prominently done by using X-ray powder diffraction (XRD) technique. Besides this, the MATLAB based digital image processing analysis of the Scanning Electron Microscope (SEM) image can provide more better assessment of the contribution of isolated constitute magnetic fragments of designed DMSs. In the present research work, particle distribution analysis has been done using XRD, XPS and SEM image assessment of Co (at 4.5% molar concentration) doped zinc oxide (ZnO) doped dilute magnetic semiconductor specimen. The XRD scans ratify that Co ions replace the Zn site and no structural change has been noted after the sintering. The XPS results reveal that Co atoms have been successfully incorporated in sites of the ZnO matrics without forming any noticeable impurity phase. Moreover, MATLAB based particle distribution analysis and watershed analysis techniques are also applied to the SEM image. The study reveals that the ZnO converts into semi hexagonal prism-like shaped grains from floret-like shaped grains due to Co doping by retaining their nano-dimension and adequate distribution for the Zn0.955Co0.045O specimen. (C) 2020 Elsevier Ltd. All rights reserved.