A wavelength dispersive X-ray spectrometer for small area X-ray fluorescence spectroscopy at SPring-8 BL39XU

被引:20
|
作者
Hayakawa, S [1 ]
Yamaguchi, A
Hong, W
Gohshi, Y
Yamamoto, T
Hayashi, K
Kawai, J
Goto, S
机构
[1] Univ Tokyo, Sch Engn, Dept Appl Chem, Tokyo 1138656, Japan
[2] Kyoto Univ, Dept Mat Sci & Engn, Sakyo Ku, Kyoto 6068501, Japan
[3] JASRI, Kamigori, Hyogo 6795198, Japan
关键词
X-ray fluorescence; SPring-8; wavelength-dispersive spectrometer; position sensitive proportional counter; resonant inelastic scattering;
D O I
10.1016/S0584-8547(98)00206-7
中图分类号
O433 [光谱学];
学科分类号
0703 ; 070302 ;
摘要
A wavelength dispersive X-ray spectrometer is designed and developed for X-ray fluorescence analysis and spectroscopy using an X-ray microprobe at SPring-8 BL39XU. The spectrometer uses a flat analyzer crystal, and X-rays from a small beam spot are dispersed by the crystal onto a position sensitive proportional counter. The energy resolution of the spectrometer is determined by the spatial resolution of the position sensitive proportional counter, and the additional use of the slit-scan can improve the energy resolution if necessary. Performance of the spectrometer is evaluated by using a conventional X-ray source, and preliminary experimental results of the X-ray microprobe by using brilliant hard X-rays from an X-ray undulator are reported. (C) 1999 Elsevier Science B.V. All rights reserved.
引用
收藏
页码:171 / 177
页数:7
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