Ultrasonic thin film transducers for high-temperature NDT

被引:11
|
作者
Kirk, KJ [1 ]
Lee, CK [1 ]
Cochran, S [1 ]
机构
[1] Univ Paisley, Sch Comp J123, Paisley PA1 2BE, Renfrew, Scotland
关键词
D O I
10.1784/insi.47.2.85.58980
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
Ultrasonic thin films have advantages over conventional transducers for non-destractive testing, especially at high temperatures. We have demonstrated thin film ultrasonic devices in operation at temperatures over 400degreesC. Pulse-echo and through-transmission modes have been used, with standard ultrasonic pulser-receivers. The films are deposited directly onto the test components, thus eliminating problems with acoustic coupling (it high temperatures. Transducers formed in this way are low-profile, unlike water-cooled transducers or those requiring thermal isolation via buffer rods. It is possible to deposit the films onto curved surfaces and extensive surface preparation is not required. Pulse-echo tests have been carried out on aluminium and mild steel components, showing that back-wall echoes and simulated defects can be detected through several centimetres of material. There are clearly important potential applications in non-destructive testing at high temperatures including detection of defects in hot components and monitoring pipe-wall thickness in high-temperature plant.
引用
收藏
页码:85 / 87
页数:3
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