Development of sputtered AlN thin-film ultrasonic transducers for durable high-temperature applications

被引:12
|
作者
Hou, R. [1 ]
Hutson, D. [1 ]
Kirk, K. J. [1 ]
机构
[1] Univ West Scotland, Microscale Sensors Grp, Sch Engn, Paisley PA1 2BE, Renfrew, Scotland
基金
英国工程与自然科学研究理事会;
关键词
ALUMINUM NITRIDE; GAPO4; GENERATION;
D O I
10.1784/insi.2012.55.6.302
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
This paper presents some of the recent experimental work on developing AlN ultrasonic transducers for high-temperature NDT applications. C-axis oriented AlN films were grown on stainless steel SS316 substrate by RF sputtering deposition. The high-temperature performance and durability of the transducer were examined by pulse-echo experiments after heating to different temperatures. It can be shown that the sputtered AlN film transducer is capable of highly stable and durable performance at 400 degrees C or above, with appropriate choice of substrate, buffer layer, electroding materials and electroding approaches. Experimental evidence also indicates that transducers made of sputtered AlN film and a molybdenum buffer layer on a stainless steel substrate could potentially operate at up to 800 degrees C.
引用
收藏
页码:302 / 307
页数:6
相关论文
共 50 条
  • [1] Investigation of thin-film ultrasonic transducers for high-temperature applications
    Hou, Ruozhou
    Hutson, D.
    Kirk, K. J.
    [J]. INSIGHT, 2012, 54 (02) : 68 - 71
  • [2] SPUTTERED HIGH-TEMPERATURE THIN-FILM THERMOCOUPLES
    KREIDER, KG
    [J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1993, 11 (04): : 1401 - 1405
  • [3] Ultrasonic thin film transducers for high-temperature NDT
    Kirk, KJ
    Lee, CK
    Cochran, S
    [J]. INSIGHT, 2005, 47 (02) : 85 - 87
  • [4] Thin-Film Characterization for High-Temperature Applications
    M. J. Lourenço
    J. M. Serra
    M. R. Nunes
    A. M. Vallêra
    C. A. Nieto de Castro
    [J]. International Journal of Thermophysics, 1998, 19 : 1253 - 1265
  • [5] Thin-film characterization for high-temperature applications
    Lourenco, MJ
    Serra, JM
    Nunes, MR
    Vallera, AM
    de Castro, CAN
    [J]. INTERNATIONAL JOURNAL OF THERMOPHYSICS, 1998, 19 (04) : 1253 - 1265
  • [6] High temperature AlN thin film ultrasonic transducers with dual mode wave excitation
    Xu, Chang
    Zeng, Xiaomei
    Zhang, Xiangyu
    Zeng, Zhong
    Chen, Zhiwen
    Neena, D.
    Li, Ming
    Zhang, Jun
    Yang, Bing
    Liu, Sheng
    Pelenovich, Vasiliy
    [J]. CERAMICS INTERNATIONAL, 2024, 50 (05) : 7480 - 7485
  • [7] AlN thin film transducers for high temperature non-destructive testing applications
    Hou, Ruozhou
    Hutson, David
    Kirk, Katherine J.
    Fu, Yong Qing
    [J]. JOURNAL OF APPLIED PHYSICS, 2012, 111 (07)
  • [8] FABRICATION OF DIAMOND THIN-FILM THERMISTORS FOR HIGH-TEMPERATURE APPLICATIONS
    BADE, JP
    SAHAIDA, SR
    STONER, BR
    VONWINDHEIM, JA
    GLASS, JT
    MIYATA, K
    NISHIMURA, K
    KOBASHI, K
    [J]. DIAMOND AND RELATED MATERIALS, 1993, 2 (5-7) : 816 - 819
  • [9] HIGH-TEMPERATURE SUPERCONDUCTING THIN-FILM STRUCTURES FOR ELECTRONIC APPLICATIONS
    GERSHENSON, ME
    FALEY, MI
    NEVELSKAYA, JE
    [J]. CRYOGENICS, 1992, 32 : 575 - 578
  • [10] DEVELOPMENT OF HIGH-TEMPERATURE ULTRASONIC TRANSDUCERS FOR UNDER-SODIUM VIEWING APPLICATIONS
    FOTHERGILL, JR
    WILLIS, P
    WAYWELL, S
    [J]. BRITISH JOURNAL OF NON-DESTRUCTIVE TESTING, 1989, 31 (05): : 259 - 264