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Curved Diffractive X-ray Optics for X-ray Astronomy
被引:1
|作者:
DeRoo, Casey T.
[1
]
McEntaffer, Randall L.
[2
]
Donovan, Benjamin D.
[2
]
Grise, Fabien
[2
]
Zhang, William W.
[3
]
Collon, Maximilien
[4
]
Barriere, Nicolas
[4
]
机构:
[1] Univ Iowa, Dept Phys & Astron, Van Allen Hall, Iowa City, IA 52242 USA
[2] Penn State Univ, Dept Astron & Astrophys, 525 Davey Lab, University Pk, PA 16802 USA
[3] NASA, Goddard Space Flight Ctr, Greenbelt, MD USA
[4] Cosine Measurement Syst, Oosteinde 36, NL-2361 HE Warmond, Netherlands
来源:
关键词:
diffraction gratings;
electron beam lithography;
freeform optics;
X-ray spectroscopy;
BARYONS;
D O I:
10.1117/12.2528817
中图分类号:
P1 [天文学];
学科分类号:
0704 ;
摘要:
We report on a concept for curved diffractive X-ray optics (CDXO). CDXO would enable potential new optical designs for X-ray instruments, such as a two element spectrometer, in which the secondary element of an Xray mirror pair is patterned with an X-ray grating. A two-element spectrometer design eliminates the grating assembly, resulting in decreased instrument mass and reduced power requirements. In addition, a two-element spectrometer may realize cost/schedule savings by eliminating a separate grating alignment effort, and yield increased effective area over three element designs. We present a raytrace concept study of a two-element spectrometer compact enough to fit within a sounding rocket payload. We also review the progress made in electron-beam lithography (EBL) techniques that would enable curved diffractive X-ray optics to be patterned, and outline a procedure by which the accuracy of the EBL patterning process can be measured interferometrically.
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