Curved Diffractive X-ray Optics for X-ray Astronomy

被引:1
|
作者
DeRoo, Casey T. [1 ]
McEntaffer, Randall L. [2 ]
Donovan, Benjamin D. [2 ]
Grise, Fabien [2 ]
Zhang, William W. [3 ]
Collon, Maximilien [4 ]
Barriere, Nicolas [4 ]
机构
[1] Univ Iowa, Dept Phys & Astron, Van Allen Hall, Iowa City, IA 52242 USA
[2] Penn State Univ, Dept Astron & Astrophys, 525 Davey Lab, University Pk, PA 16802 USA
[3] NASA, Goddard Space Flight Ctr, Greenbelt, MD USA
[4] Cosine Measurement Syst, Oosteinde 36, NL-2361 HE Warmond, Netherlands
关键词
diffraction gratings; electron beam lithography; freeform optics; X-ray spectroscopy; BARYONS;
D O I
10.1117/12.2528817
中图分类号
P1 [天文学];
学科分类号
0704 ;
摘要
We report on a concept for curved diffractive X-ray optics (CDXO). CDXO would enable potential new optical designs for X-ray instruments, such as a two element spectrometer, in which the secondary element of an Xray mirror pair is patterned with an X-ray grating. A two-element spectrometer design eliminates the grating assembly, resulting in decreased instrument mass and reduced power requirements. In addition, a two-element spectrometer may realize cost/schedule savings by eliminating a separate grating alignment effort, and yield increased effective area over three element designs. We present a raytrace concept study of a two-element spectrometer compact enough to fit within a sounding rocket payload. We also review the progress made in electron-beam lithography (EBL) techniques that would enable curved diffractive X-ray optics to be patterned, and outline a procedure by which the accuracy of the EBL patterning process can be measured interferometrically.
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页数:9
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