Arbitrary waveform power controller for thermal measurements of semiconductor devices

被引：5

作者：

Davidson, J. N. ^{[1
]}

Stone, D. A. ^{[1
]}

Foster, M. P. ^{[1
]}

机构：

[1] Univ Sheffield, Dept Elect & Elect Engn, Sheffield S1 3JD, S Yorkshire, England

来源：

ELECTRONICS LETTERS | 2012年 / 48卷 / 07期

基金：

英国工程与自然科学研究理事会;

关键词：

D O I：

10.1049/el.2011.3927

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

Presented is a simple and easy-to-implement design for an arbitrary waveform power controller. The power dissipation in an active semiconductor device is controlled by virtue of its current and voltage for any waveform. By measuring the heating effect on an electronic product, an engineer can evaluate the effectiveness of its design. The controller is demonstrated practically with a MOSFET using an arbitrary waveform, and power dissipated in the device agrees well with intended dissipation.

引用

页码：400 / U141

页数：2

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