Contribution of the metrology to the study of laser induced damage with multiple longitudinal mode pulses

被引：1

作者：

Diaz, R. ^{[1
]}

Chambonneau, M. ^{[1
]}

Courchinoux, R. ^{[1
]}

Luce, J. ^{[1
]}

Natoli, J. -Y. ^{[2
]}

Lamaignere, L. ^{[1
]}

机构：

[1] CEA CESTA, F-33116 Le Barp, France

[2] Aix Marseille Univ, CNRS, Inst Fresnel, UMR 7249,Ecole Cent Marseille, F-13013 Marseille, France

来源：

PACIFIC RIM LASER DAMAGE 2014: OPTICAL MATERIALS FOR HIGH POWER LASERS | 2014年 / 9238卷

关键词：

Nd:YAG; Metrology; Longitudinal Mode Beating; Spectro-temporal fluctuations;

D O I：

10.1117/12.2073237

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

With the purpose of understanding nanosecond laser induced damage mechanisms when working with multiple longitudinal mode pulses, an accurate measurement of the temporal profiles is required. In this study, the use of a streak camera with a wide bandwidth is justified through the knowledge of the Nd:YAG spectral characteristics. A statistical and phenomenological analysis of multiple longitudinal modes intensity profiles is then performed through experiments and modeling. The resolution limitation of our photodiodes is also discussed.

引用

页数：4

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