Time-Domain Modeling of All-Digital PLLs to Single-Event Upset Perturbations

被引：4

作者：

Chen, Y. P. ^{[1
]}

Massengill, L. W. ^{[1
]}

Sternberg, A. L. ^{[1
]}

Zhang, E. X. ^{[1
]}

Kauppila, J. S. ^{[1
]}

Yao, M. ^{[2
]}

Amort, A. L. ^{[2
]}

Bhuva, B. L. ^{[1
]}

Holman, W. T. ^{[1
]}

Loveless, T. D. ^{[3
]}

机构：

[1] Vanderbilt Univ, 221 Kirkland Hall, Nashville, TN 37235 USA

[2] Boeing Co, Seattle, WA 98124 USA

[3] Univ Tennessee, Chattanooga, TN 37403 USA

来源：

IEEE TRANSACTIONS ON NUCLEAR SCIENCE | 2018年 / 65卷 / 01期

关键词：

Fault injection; phase-locked loop (PLL); single event (SE) modeling; single-event upset (SEU);

D O I：

10.1109/TNS.2017.2772262

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

A uniform technology-agnostic time-domain model for both linear and nonlinear all-digital phase-locked loops (ADPLLs) is presented. This time-domain model can be used for single-event upset (SEU)-induced perturbation time prediction and SEU sensitivity characterization of common ADPLL topologies. The model is validated against field-programmable gate array-based fault injection experiments and two photon absorption laser experimental results on three different types of designs. The model is applicable to rad-harden by design activities, failure mode predictions, and general ADPLL design optimizations.

引用

页码：311 / 317

页数：7

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