Room temperature GaN bonding by surface activated bonding methods

被引:0
|
作者
Mu, Fengwen [1 ]
Suga, Tadatomo [1 ]
机构
[1] Univ Tokyo, Dept Precis Engn, Tokyo, Japan
关键词
GaN; bonding; room temperature; SAB; interface; HEMTS; POWER; SI;
D O I
暂无
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
In this work, both GaN-Si and GaN-diamond bonding at room temperature were achieved by surface activated bonding (SAB) methods. In the GaN-Si bonding by standard SAB, the results of Ga-face to Si bonding are better than that of N-face to Si bonding such as higher bonding energy. Both of the structure and composition of the two kinds of GaN-Si interfaces were investigated to understand the bonding mechanisms. In the GaN-diamond bonding by modified SAB using an intermediate Si nano-layer, a uniformly seamless bonding interface was achieved. The GaN-diamond bonded structure is expected to be helpful for the applications of high-power GaN devices.
引用
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页码:521 / 524
页数:4
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