Texture, residual strain, and plastic deformation around scratches in alloy 600 using synchrotron X-ray Laue micro-diffraction

被引：18
|
作者：
Fuller, M. L. Suominen [1 ]
Klassen, R. J. [2 ]
McIntyre, N. S. [1 ]
Gerson, A. R. [3 ]
Ramarnurthy, S. [1 ]
King, P. J. [4 ]
Liu, W. [5 ]
机构：
[1] Univ Western Ontario, Western Sci Ctr, London, ON N6A 5B7, Canada
[2] Univ Western Ontario, Dept Mech & Mat Engn, London, ON N6A 5B9, Canada
[3] Univ S Australia, Appl Ctr Struct & Synchrotron Studies, Adelaide, SA 5095, Australia
[4] Babcock & Wilcox Canada, Cambridge, ON N1R 5V3, Canada
[5] Argonne Natl Lab, Adv Photon Source, Argonne, IL 60439 USA
来源：
JOURNAL OF NUCLEAR MATERIALS | 2008年 / 374卷 / 03期
关键词：
D O I：
10.1016/j.jnucmat.2007.10.015
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
Deformation around two scratches in Alloy 600 (A600) was studied nondestructively using synchrotron Laue differential aperture X-ray microscopy. The orientation of grains and elastic strain distribution around the scratches were measured. A complex residual deviatoric elastic strain state was found to exist around the scratches. Heavy plastic deformation was observed up to a distance of 20 gm from the scratches. In the region 20-30 mu m from the scratches the diffraction spots were heavily streaked and split indicating misoriented dislocation cell structures. (C) 2007 Elsevier B.V. All rights reserved.
引用
收藏
页码：482 / 487
页数：6
相关论文
共 50 条
  • [1] Analysis of plastic deformation and residual elastic strain in a titanium alloy using synchrotron x-ray diffraction
    Golshan, M
    Liu, J
    Kim, K
    Laundy, D
    Dini, D
    Korsunsky, AM
    [J]. JOURNAL OF PHYSICS D-APPLIED PHYSICS, 2005, 38 (10A) : A195 - A199
  • [2] Application of synchrotron X-ray diffraction and nanoindentation for the determination of residual stress fields around scratches
    Khan, M. K.
    Fitzpatrick, M. E.
    Hainsworth, S. V.
    Evans, A. D.
    Edwards, L.
    [J]. ACTA MATERIALIA, 2011, 59 (20) : 7508 - 7520
  • [3] Recovery of deformation microstructure in the bulk interior revealed by synchrotron X-ray micro-diffraction
    Yu, Tianbo
    Hong, Chuanshi
    Zhang, Yubin
    Lindkvist, Adam
    Liu, Wenjun
    Tischler, Jon
    Jensen, Dorte Juul
    [J]. MATERIALS CHARACTERIZATION, 2023, 202
  • [4] Plastic Deformation of Insb Micro-Pillars: A comparative Study Between Spatially Resolved Laue and Monochromatic X-Ray Micro-Diffraction Maps
    Sadat, Tarik
    Verezhak, Mariana
    Godard, Pierre
    Renault, Pierre Olivier
    Van Petegem, Steven
    Jacques, Vincent
    Diaz, Ana
    Grolimund, Daniel
    Thilly, Ludovic
    [J]. RESIDUAL STRESSES 2018, ECRS-10, 2018, 6 : 21 - 26
  • [5] Lattice strain and tilt mapping in stressed Ge microstructures using X-ray Laue micro-diffraction and rainbow filtering
    Tardif, Samuel
    Gassenq, Alban
    Guilloy, Kevin
    Pauc, Nicolas
    Dias, Guilherme Osvaldo
    Hartmann, Jean-Michel
    Widiez, Julie
    Zabel, Thomas
    Marin, Esteban
    Sigg, Hans
    Faist, Jerome
    Chelnokov, Alexei
    Reboud, Vincent
    Calvo, Vincent
    Micha, Jean-Sebastien
    Robach, Odile
    Rieutord, Francois
    [J]. JOURNAL OF APPLIED CRYSTALLOGRAPHY, 2016, 49 : 1402 - 1411
  • [6] Lattice strain and tilt mapping in stressed Ge microstructures using X-ray Laue micro-diffraction and rainbow filtering
    Tardif, Samuel
    Gassenq, Alban
    Guilloy, Kevin
    Pauc, Nicolas
    Osvaldo Dias, Guilherme
    Hartmann, Jean-Michel
    Widiez, Julie
    Zabel, Thomas
    Marin, Esteban
    Sigg, Hans
    Faist, Jérôme
    Chelnokov, Alexei
    Reboud, Vincent
    Calvo, Vincent
    Micha, Jean-Sébastien
    Robach, Odile
    Rieutord, François
    [J]. Journal of Applied Crystallography, 2016, 49 : 1402 - 1411
  • [7] Lattice strain and tilt mapping in stressed Ge microstructures using X-ray Laue micro-diffraction and rainbow filtering
    [J]. Tardif, Samuel (samuel.tardif@cea.fr), 1600, International Union of Crystallography, 5 Abbey Road, Chester, CH1 2HU, United Kingdom (49):
  • [8] Microstructural effects of strain aging on NiTi pseudoelastic wires by synchrotron X-ray micro-diffraction
    Isalgue, Antonio
    Auguet, Carlota
    Concustell, Amadeu
    Cinca, Nuria
    [J]. ESOMAT 2015 - 10TH EUROPEAN SYMPOSIUM ON MARTENSITIC TRANSFORMATIONS, 2015, 33
  • [9] Tin whiskers studied by synchrotron radiation scanning X-ray micro-diffraction
    Choi, WJ
    Lee, TY
    Tu, KN
    Tamura, N
    Celestre, RS
    MacDowell, AA
    Bong, YY
    Nguyen, L
    [J]. ACTA MATERIALIA, 2003, 51 (20) : 6253 - 6261
  • [10] Alignment of sample position and rotation during in situ synchrotron X-ray micro-diffraction experiments using a Laue cross-correlation approach
    Zhang, Chenglu
    Zhang, Yubin
    Wu, Guilin
    Liu, Wenjun
    Xu, Ruqing
    Juul Jensen, Dorte
    Godfrey, Andrew
    [J]. JOURNAL OF APPLIED CRYSTALLOGRAPHY, 2019, 52 : 1119 - 1127
12345