Improved photoresponse of InAs/GaAs quantum dot infrared photodetectors by using GaAs1-xSbx strain reducing layer

被引:17
|
作者
Huang, Chia-Tze [1 ]
Chen, Yu-Cheng
Lee, Si-Chen
机构
[1] Natl Taiwan Univ, Dept Elect Engn, Grad Inst Elect Engn, Taipei 10617, Taiwan
关键词
TEMPERATURE; OPERATION;
D O I
10.1063/1.3679132
中图分类号
O59 [应用物理学];
学科分类号
摘要
The effect of a GaAs1-xSbx strain reducing layer on the performance of InAs/GaAs quantum-dot infrared photodetectors was investigated. The results suggest that increasing Sb composition x from 0 to 0.2 leads to an enhanced peak response and a pronounced narrowing of the band width of the spectral response from 3.3 to 1.5 mu m. For a photodetector with GaAs0.8Sb0.2 strain reducing layer, the best responsivity obtained is 533 mA/W, which is 380 times higher than that without strain reducing layer. In addition, the operating temperature increases from 50 to 90 K when increasing Sb composition from 0 to 0.2. (C) 2012 American Institute of Physics. [doi: 10.1063/1.3679132]
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页数:4
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