Universal optical setup for phase-shifting and spatial-carrier digital speckle pattern interferometry

被引：14

作者：

Wu, Sijin ^{[1
]}

Dong, Mingli ^{[1
]}

Fang, Yao ^{[1
]}

Yang, Lianxiang ^{[1
,2
]}

机构：

[1] Beijing Informat Sci & Technol Univ, Sch Instrumentat Sci & Optoelect Engn, Beijing 100192, Peoples R China

[2] Oakland Univ, Dept Mech Engn, Rochester, MI 48309 USA

来源：

JOURNAL OF THE EUROPEAN OPTICAL SOCIETY-RAPID PUBLICATIONS | 2016年 / 12卷

基金：

中国国家自然科学基金;

关键词：

Digital speckle pattern interferometry; Phase shift; Spatial carrier; Deformation measurement; Universal optical setup; Digital holographic interferometry; HOLOGRAPHIC-INTERFEROMETRY; SHEAROGRAPHY;

D O I：

10.1186/s41476-016-0016-6

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

Background: Digital speckle pattern interferometry (DSPI) is a competitive optical tool for full-field deformation measurement. The two main types of DSPI, phase-shifting DSPI (PS-DSPI) and spatial-carrier DSPI (SC-DSPI), are distinguished by their unique optical setups and methods of phase determination. Each DSPI type has its limited ability in practical applications. Results: We designed a universal optical setup that is suitable for both PS-DSPI and SC-DSPI, with the aim of integrating their respective advantages, including PS-DSPI's precise measurement and SC-DSPI's synchronous measurement, improving DSPI's measuring capacity in engineering. Conclusion: The proposed setup also has several other advantages, including a simple and robust structure, easy adjustment and operation, and versatility of measuring approach.

引用

页数：9

共 50 条

[41] Spatial phase shifting in electronic speckle pattern interferometry: Minimization of phase reconstruction errors
Bothe, T
Burke, J
Helmers, H
[J]. APPLIED OPTICS, 1997, 36 (22) : 5310 - 5316
[42] Spatial Carrier Digital Speckle Pattern Interferometry System with Large Field of View
Liu Tiancheng
Wu Sijin
Li Weixian
[J]. CHINESE JOURNAL OF LASERS-ZHONGGUO JIGUANG, 2020, 47 (09):
[43] Least-squares phase estimation with multiple parameters in phase-shifting electronic speckle pattern interferometry
Yun, HY
Hong, CK
Chang, SW
[J]. JOURNAL OF THE OPTICAL SOCIETY OF AMERICA A-OPTICS IMAGE SCIENCE AND VISION, 2003, 20 (02): : 240 - 247
[44] Phase measurement in temporal speckle pattern interferometry: comparison between the phase-shifting and the Fourier transform methods
Kaufmann, GH
Galizzi, GE
[J]. APPLIED OPTICS, 2002, 41 (34) : 7254 - 7263
[45] Decorrelation-induced phase errors in phase-shifting speckle interferometry
Lehmann, M
[J]. APPLIED OPTICS, 1997, 36 (16): : 3657 - 3667
[46] LEAST-SQUARES FITTING OF THE PHASE MAP OBTAINED IN PHASE-SHIFTING ELECTRONIC SPECKLE PATTERN INTERFEROMETRY
HONG, CK
RYU, HS
LIM, HC
[J]. OPTICS LETTERS, 1995, 20 (08) : 931 - 933
[47] Phase-shifting speckle interferometry: A noise reduction filter for phase unwrapping
Capanni, A
Pezzati, L
Bertani, D
Cetica, M
Francini, F
[J]. OPTICAL ENGINEERING, 1997, 36 (09) : 2466 - 2472
[48] Study of adaptive elliptical ideal low-pass filters used for denoising of digital speckle interferograms obtained in phase-shifting digital speckle pattern interferometry
Wang, Gaojianyong
Wang, Kaifu
[J]. JOURNAL OF MODERN OPTICS, 2013, 60 (13) : 1090 - 1098
[49] Phase-shifting speckle interferometry with unresolved speckles: A theoretical investigation
Lehmann, M
[J]. OPTICS COMMUNICATIONS, 1996, 128 (4-6) : 325 - 340
[50] Comparative measurement by phase-shifting digital speckle interferometry using holographically generated reference wave
Moustafa, NA
Kornis, J
Füzessy, Z
[J]. OPTICAL ENGINEERING, 1999, 38 (07) : 1241 - 1245

← 1 2 3 4 5 →