Automatic test generation for predicates

被引：2
|
作者：
Paradkar, A [1 ]
Tai, KC [1 ]
Vouk, MA [1 ]
机构：
[1] N CAROLINA STATE UNIV,DEPT COMP SCI,RALEIGH,NC 27695
来源：
SEVENTH INTERNATIONAL SYMPOSIUM ON SOFTWARE RELIABILITY ENGINEERING, PROCEEDINGS | 1996年
关键词：
automated test data generation; specification-based testing; cause-effect graphs; predicates;
D O I：
10.1109/ISSRE.1996.558700
中图分类号：
TP31 [计算机软件];
学科分类号：
081202 ; 0835 ;
摘要：
引用
收藏
页码：66 / 75
页数：10
相关论文
共 50 条
  • [1] Automatic test-generation for predicates
    Paradkar, A
    Tai, KC
    Vouk, MA
    [J]. IEEE TRANSACTIONS ON RELIABILITY, 1996, 45 (04) : 515 - 530
  • [2] Automatic generation of staged geometric predicates
    Nanevski, A
    Blelloch, G
    Harper, R
    [J]. ACM SIGPLAN NOTICES, 2001, 36 (10) : 217 - 228
  • [3] Test Case Generation from Conjunctions of Predicates with Model Checking
    TIAN Cong
    LIU Shaoying
    DUAN Zhenhua
    [J]. Chinese Journal of Electronics, 2014, 23 (02) : 271 - 277
  • [4] Test Case Generation from Conjunctions of Predicates with Model Checking
    Tian Cong
    Liu Shaoying
    Duan Zhenhua
    [J]. CHINESE JOURNAL OF ELECTRONICS, 2014, 23 (02) : 271 - 277
  • [5] AUTOMATIC GENERATION OF TEST CASES
    HANFORD, KV
    [J]. IBM SYSTEMS JOURNAL, 1970, 9 (04) : 242 - &
  • [6] A system for automatic test generation
    Bondar, YS
    Katkov, VL
    [J]. PROGRAMMING AND COMPUTER SOFTWARE, 1995, 21 (06) : 288 - 292
  • [7] Automatic test generation with AGATHA
    Bigot, C
    Faivre, A
    Gallois, JP
    Lapitre, A
    Lugato, D
    Pierron, JY
    Rapin, N
    [J]. TOOLS AND ALGORITHMS FOR THE CONSTRUCTION AND ANALYSIS OF SYSTEMS, PROCEEDINGS, 2003, 2619 : 591 - 596
  • [8] Automatic Test Packet Generation
    Zeng, Hongyi
    Kazemian, Peyman
    Varghese, George
    McKeown, Nick
    [J]. IEEE-ACM TRANSACTIONS ON NETWORKING, 2014, 22 (02) : 554 - 566
  • [9] AUTOMATIC TEST SEQUENCE GENERATION
    SALZMANN, CH
    [J]. IEEE TRANSACTIONS ON AEROSPACE AND ELECTRONIC SYSTEMS, 1977, 13 (02) : 223 - 223
  • [10] Automatic test pattern generation
    Drechsler, Rolf
    Fey, Gorschwin
    [J]. FORMAL METHODS FOR HARDWARE VERIFICATION, 2006, 3965 : 30 - 55
12345