Oriented organic semiconductor thin films

被引：15
|
作者：
Andreev, A [1 ]
Resel, R
Smilgies, DM
Hoppe, H
Matt, G
Sitter, H
Sariciftci, NS
Meissner, D
Plank, H
Zrzavecka, O
机构：
[1] Univ Linz, Inst Semicond & Solid State Phys, A-4040 Linz, Austria
[2] Graz Univ Technol, Inst Solid State Phys, A-8010 Graz, Austria
[3] Cornell Univ, CHESS G Line, Ithaca, NY 14853 USA
[4] Univ Linz, Inst Phys Chem, A-4040 Linz, Austria
[5] Univ Linz, LIOS, A-4040 Linz, Austria
[6] Masaryk Univ, Inst Condensed Matter Phys, Brno, Czech Republic
来源：
SYNTHETIC METALS | 2003年 / 138卷 / 1-2期
关键词：
organic epitaxy; crystalline thin films; atomic force microscopy; X-ray diffraction;
D O I：
10.1016/S0379-6779(03)00025-0
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
In this part of our investigations, we mainly use atomic force microscopy to study the growth of para-sexiphenyl (PSP) films on mica. It is shown that self-organization of PSP molecules occurs during the deposition controlled by the substrate temperature and deposition time. In addition, X-ray diffraction (XRD) measurements were performed using synchrotron radiation. They confirmed the very high crystalline quality of the grown films. (C) 2003 Elsevier Science B.V. All rights reserved.
引用
收藏
页码：59 / 63
页数：5
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