White light velocity interferometry

被引：0
|
作者：
Erskine, DJ [1 ]
Holmes, NC [1 ]
机构：
[1] LAWRENCE LIVERMORE NATL LAB, LIVERMORE, CA 94551 USA
来源：
SHOCK COMPRESSION OF CONDENSED MATTER - 1995 | 1996年 / 370卷
关键词：
D O I：
暂无
中图分类号：
O42 [声学];
学科分类号：
070206 ; 082403 ;
摘要：
引用
收藏
页码：1003 / 1005
页数：3
相关论文
共 50 条
  • [41] USE OF MULTILAYER DIELECTRIC COATINGS FOR WHITE LIGHT INTERFEROMETRY
    SHKLYAREVSKII, IN
    KORNEEVA, TI
    LUPASHKO, EA
    OPTICS AND SPECTROSCOPY-USSR, 1967, 22 (06): : 528 - +
  • [42] Stroboscopic white-light interferometry of vibrating microstructures
    Shavrin, Igor
    Lipiainen, Lauri
    Kokkonen, Kimmo
    Novotny, Steffen
    Kaivola, Matti
    Ludvigsen, Hanne
    OPTICS EXPRESS, 2013, 21 (14): : 16901 - 16907
  • [43] Measurement of the influence of dispersion on white-light interferometry
    Pavlicek, P
    Soubusta, J
    APPLIED OPTICS, 2004, 43 (04) : 766 - 770
  • [44] Scanning white-light interferometry with a supercontinuum source
    Kassamakov, Ivan
    Hanhijarvi, Kalle
    Abbadi, Imad
    Aaltonen, Juha
    Ludvigsen, Hanne
    Haeggstrom, Edward
    OPTICS LETTERS, 2009, 34 (10) : 1582 - 1584
  • [45] Surface Roughness Evaluation with Using White Light Interferometry
    Kato, Kenichi
    Akiyama, Yu
    Fukamachi, Hiroyuki
    Matsuda, Koji
    Mouri, Toshihiko
    Aoki, Atsuya
    Ozaki, Yukiko
    Takeda, Yoshinobu
    Funtai Oyobi Fummatsu Yakin/Journal of the Japan Society of Powder and Powder Metallurgy, 2025, 72
  • [46] Measurement of Steep Surfaces Using White Light Interferometry
    Coupland, J. M.
    Lobera, J.
    STRAIN, 2010, 46 (01): : 69 - 78
  • [47] Height profile measurement by means of white light interferometry
    Pavlícek, P
    13TH POLISH-CZECH-SLOVAK CONFERENCE ON WAVE AND QUANTUM ASPECTS OF CONTEMPORARY OPTICS, 2003, 5259 : 139 - 144
  • [48] Some challenges in white light phase shifting interferometry
    Schmit, J
    Olszak, AG
    INTERFEROMETRY XI: TECHNIQUES AND ANALYSIS, 2002, 4777 : 118 - 127
  • [49] A novel surface recovery algorithm in white light interferometry
    Lei, Zili
    Liu, Xiaojun
    Chen, Liangzhou
    Lu, Wenlong
    Chang, Suping
    MEASUREMENT, 2016, 80 : 1 - 11
  • [50] White light interferometry applied to wavelength calibration of spectrometers
    Gonzalez-Nunez, Hector
    de la Fuente, Raul
    8TH IBEROAMERICAN OPTICS MEETING AND 11TH LATIN AMERICAN MEETING ON OPTICS, LASERS, AND APPLICATIONS, 2013, 8785
12345