White light velocity interferometry

被引:0
|
作者
Erskine, DJ [1 ]
Holmes, NC [1 ]
机构
[1] LAWRENCE LIVERMORE NATL LAB, LIVERMORE, CA 94551 USA
关键词
D O I
暂无
中图分类号
O42 [声学];
学科分类号
070206 ; 082403 ;
摘要
引用
收藏
页码:1003 / 1005
页数:3
相关论文
共 50 条
  • [1] White light interferometry
    Wyant, JC
    HOLOGRAPHY: A TRIBUTE TO YURI DENISYUK AND EMMETT LEITH, 2002, 4737 : 98 - 107
  • [2] Group velocity dispersion of dyes in solution measured with white-light interferometry
    Spivey, Amelia G. VanEngen
    Seid, Nathanael
    APPLIED OPTICS, 2011, 50 (02) : 194 - 202
  • [3] Measurement of group velocity dispersion using white light interferometry: A teaching laboratory experiment
    Cormack, IG
    Baumann, F
    Reid, DT
    AMERICAN JOURNAL OF PHYSICS, 2000, 68 (12) : 1146 - 1150
  • [4] White light interferometry applications in nanometrology
    Damian, V.
    Bojan, M.
    Schiopu, P.
    Iordache, I.
    Ionita, B.
    Apostol, D.
    ADVANCED TOPICS IN OPTOELECTRONICS, MICROELECTRONICS, AND NANOTECHNOLOGIES IV, 2009, 7297
  • [5] MOIRE INTERFEROMETRY WITH WHITE-LIGHT
    POST, D
    APPLIED OPTICS, 1979, 18 (24): : 4163 - 4167
  • [6] Fringe spacing in white light interferometry
    Schmit, J
    Unruh, P
    Wan, DS
    INTERFEROMETRY XII: TECHNIQUES AND ANALYSIS, 2004, 5531 : 228 - 235
  • [7] White light interferometry with reference signal
    Schmit, J
    Olszak, AG
    McDermed, S
    INTERFEROMETRY XI: TECHNIQUES AND ANALYSIS, 2002, 4777 : 102 - 109
  • [8] DISPERSION EFFECTS IN WHITE LIGHT INTERFEROMETRY
    JACOBSSON, G
    ACTA CHEMICA SCANDINAVICA, 1953, 7 (04): : 582 - 590
  • [9] A scattering spectrometer for white light interferometry
    Sun, Qi
    Williamson, James
    Vettenburg, Tom
    Phillips, David B.
    Martin, Haydn
    Brambilla, Gilberto
    Jiang, Xiangqian
    Beresna, Martynas
    OPTICS AND LASERS IN ENGINEERING, 2023, 169
  • [10] Simultaneous Measurement of Displacement and Velocity Using White Light Extrinsic Fabry-Perot Interferometry
    Todd, Michael D.
    Moro, Erik A.
    Puckett, Anthony
    2012 IEEE SENSORS PROCEEDINGS, 2012, : 1072 - 1075