A Simple Model for Capture and Emission Time Constants of Random Telegraph Signal Noise

被引：9

作者：

Son, Younghwan ^{[1
]}

Kang, Taewook ^{[1
]}

Park, Sunyoung ^{[1
]}

Shin, Hyungcheol ^{[1
]}

机构：

[1] Seoul Natl Univ, Sch Elect Engn & Comp Sci, Seoul 151742, South Korea

来源：

IEEE TRANSACTIONS ON NANOTECHNOLOGY | 2011年 / 10卷 / 06期

关键词：

Capture; capture cross section; emission; noise; oxide trap; random telegraph signal (RTS); time constant modeling; MULTIPHONON EMISSION; INTERFACE STATES; INVERSION-LAYERS; MOS STRUCTURES; MOSFETS;

D O I：

10.1109/TNANO.2011.2142401

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

A simple model for electron capture and emission process in oxide traps is introduced for analysis of random telegraph signal noise. Multiphonon emission capture theory is used for a "more fundamental" thermally activated capture cross-sectional model. Basically, Shockley-Read-Hall statistics is considered for time constant modeling. Particularly, the thermally activation model with the quantum effect is applied to emission time constant modeling. It is shown that the capture and emission process are controlled by characteristics of traps. Especially, the physical meaning of the lattice relaxation energy which is the most important model parameter and the trap characteristic is clarified.

引用

页码：1352 / 1356

页数：5

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