In-plane magnetic anisotropy of stepped epitaxial Fe(001) thin films probed by x-ray magnetic circular dichroism -: art. no. 174411

被引:2
|
作者
Jaffrès, H
Bertrand, D
Fert, AR
Vogel, J
Fontaine, A
Brookes, NB
Schuhl, A
Van Dau, FN
机构
[1] Inst Natl Sci Appl, CNRS, UPS, UMR 5830,Lab Phys Mat Condensee, F-31077 Toulouse 4, France
[2] Lab Magnetisme Louis Neel, CNRS, F-38042 Grenoble 9, France
[3] European Synchrotron Radiat Facil, F-38043 Grenoble, France
[4] Thomson CSF, CNRS, Unite Mixte Phys, F-91401 Orsay, France
[5] Phys Mat Lab, CNRS, UMR 7556, F-54506 Vandoeuvre Nancy, France
来源
PHYSICAL REVIEW B | 2001年 / 63卷 / 17期
关键词
D O I
10.1103/PhysRevB.63.174411
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
X-ray magnetic circular dichroism experiments were performed at the Fe L-2,L-3 edges on stepped epitaxial Fe thin films structured by the so-called atomic saw method. The measurements highlight a slight in-plane orbital moment anisotropy. The orbital moment is larger along the in-plane uniaxial easy magnetization axis corresponding to the crystallographic direction along which the tensile strain is relieved. This points out the link between the magnetocrystalline or magnetoelastic energy and the orbital moment anisotropy as predicted by Bruno's model. A theoretical approach performed within the tight-binding formalism corroborates the experimental results by evidencing the enhancement of the orbital moment along the more tightly bound direction.
引用
收藏
页码:1744111 / 1744117
页数:7
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