Effect of Cu surface segregation on the exchange coupling field of NiFe/FeMn bilayers

被引:1
|
作者
Li, MH [1 ]
Yu, GH
Zhu, FW
Jiang, HW
Lai, WY
机构
[1] Beijing Univ Sci & Technol, Dept Mat Phys, Beijing 100083, Peoples R China
[2] Chinese Acad Sci, Inst Phys, Beijing 100080, Peoples R China
来源
CHINESE SCIENCE BULLETIN | 2001年 / 46卷 / 22期
基金
中国国家自然科学基金;
关键词
NiFe/FeMn; exchange coupling field; texture; surface roughness; surface segregation;
D O I
10.1007/BF02901176
中图分类号
O [数理科学和化学]; P [天文学、地球科学]; Q [生物科学]; N [自然科学总论];
学科分类号
07 ; 0710 ; 09 ;
摘要
The NiFe/FeMn bilayers with different buffer layers (Th or Ta/Cu) were prepared by magnetron sputtering Results show that the exchange coupling field of NiFe/FeMn films with Th buffer is higher than that of the films with Ta/Cu buffer. We analysed the reasons by investigating the crystallographic texture, surface roughness and surface segregation of both films, respectively. We found that the decrease of the exchange coupling fields of NiFe/FeMn films with Ta/ Cu buffer layers was mainly caused by the Cu surface segregation on NiFe surface.
引用
收藏
页码:1934 / 1936
页数:3
相关论文
共 50 条
  • [41] A study of exchange coupling in NIFE/NIMN bilayers
    Yang, T
    Chai, CL
    Lai, WY
    MATERIALS SCIENCE AND ENGINEERING B-SOLID STATE MATERIALS FOR ADVANCED TECHNOLOGY, 2000, 76 (01): : 31 - 34
  • [42] Effect of texture and interfacial roughness on the exchange bias field of NiFe/FeMn films
    Li, Ming-Hua
    Yu, Guang-Hua
    Zhu, Feng-Wu
    Jiang, Hong-Wei
    Lai, Wu-Yan
    2002, Journal of Functional Materials (33):
  • [43] Grain-size effects in exchange-biased FeMn/NiFe bilayers
    Manzoor, S
    Vopsaroiu, M
    Vallejo-Fernandez, G
    O'Grady, K
    JOURNAL OF APPLIED PHYSICS, 2005, 97 (10)
  • [44] Influence of the roughness on the exchange bias effect of NiFe/FeMn/NiFe trilayers
    Nascimento, V. P.
    Passamani, E. C.
    Alvarenga, A. D.
    Pelegrini, F.
    Biondo, A.
    Saitovitch, E. Baggio
    JOURNAL OF MAGNETISM AND MAGNETIC MATERIALS, 2008, 320 (14) : E272 - E274
  • [45] Ferromagnetic resonance study of the exchange bias field in NiFe/FeMn/NiFe trilayers
    Nascimento, V. P.
    Saitovitch, E. Baggio
    Pelegrini, F.
    Figueiredo, L. C.
    Biondo, A.
    Passamani, E. C.
    JOURNAL OF APPLIED PHYSICS, 2006, 99 (08)
  • [46] Mn diffusion effect in the exchange biased NiFe/FeMn/NiFe trilayers
    Kim, SW
    Kim, JK
    Kim, JH
    Kim, BK
    Lee, JY
    Lee, SS
    Hwang, DG
    Rhee, JR
    JOURNAL OF APPLIED PHYSICS, 2003, 93 (10) : 6602 - 6604
  • [47] Mn diffusion effect in the exchange biased NiFe/FeMn/NiFe trilayers
    Kim, S.W. (dghwang@mail.sangji.ac.kr), 1600, American Institute of Physics Inc. (93):
  • [48] Effect of the annealing temperature on the electronic and atomic structures of exchange-biased NiFe-FeMn bilayers
    Lee, JM
    Jan, JC
    Chiou, JW
    Pong, WF
    Tsai, MH
    Chang, YK
    Chen, YY
    Wang, CR
    Lee, JF
    Yang, T
    Lu, Z
    Lai, WY
    Mai, ZH
    SURFACE REVIEW AND LETTERS, 2002, 9 (01) : 293 - 298
  • [49] Doubly exchange-biased FeMn/NiFe/Cu/NiFe/CrMnPt spin valves
    Lu, ZQ
    Lai, WY
    Zheng, YK
    IEEE TRANSACTIONS ON MAGNETICS, 2000, 36 (05) : 2899 - 2901
  • [50] Dependence of exchange bias field and coercivity on spacer layer thickness in FeMn/NiFe/Cu/NiFe spin valve structures
    Rao, B. Parvatheeswara
    Kumar, S. Ananda
    Caltun, O. F.
    Kim, Cheolgi
    JOURNAL OF OPTOELECTRONICS AND ADVANCED MATERIALS, 2008, 10 (07): : 1881 - 1884