Conformance testing of protocols specified as communicating finite state machines - A guided random walk based approach

被引:39
|
作者
Lee, D [1 ]
Sabnani, KK [1 ]
Kristol, DM [1 ]
Paul, S [1 ]
机构
[1] AT&T BELL LABS, MURRAY HILL, NJ 07974 USA
关键词
D O I
10.1109/26.494307
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
We present a new approach for conformance testing of protocols specified as a collection of communicating finite state machines (FSM's), Our approach uses a guided random walk procedure, This procedure attempts to cover all transitions in the component FSM's. We also introduce the concept of observers that check some aspect of protocol behavior, We present the result of applying our method to two example protocols: full-duplex alternating bit protocol and the ATM-adaptation-layer-convergence protocol, Applying our procedure to the ATM adaptation layer, 99% of component FSM's edges can be covered in a test with 11692 input steps, Previous approaches cannot do conformance test generation for standard protocols (such as asynchronous transfer mode (ATM) adaptation layer) specified as a collection of communicating FSM's.
引用
收藏
页码:631 / 640
页数:10
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