Physics-Based Electrical Compact Model for Monolayer Graphene FETs

被引:0
|
作者
Aguirre-Morales, J. D. [1 ]
Fregonese, S. [1 ]
Mukherjee, C. [1 ]
Maneux, C. [1 ]
Zimmer, T. [1 ]
Wei, W. [2 ]
Happy, H. [2 ]
机构
[1] Univ Bordeaux, CNRS, IMS Lab, UMR 5218, 351,Cours Liberat Line 3, F-33405 Talence, France
[2] Univ Lille, IEMN Lab, CNRS UMR 8520, F-59652 Villeneuve Dascq, France
关键词
Compact Model; FET; Graphene; Monolayer; S-Parameters; Verilog-A; TRANSISTORS;
D O I
暂无
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
In this paper, we report an accurate physics-based compact model for monolayer Graphene Field-Effect Transistors (GFETs) based on the density of states (DOS) of monolayer graphene. The charge-based model computes the total current considering a branch separation between the electron and hole contributions preserving a good accuracy near the Dirac point. The effect of back-gate is included in the charge equations applicable for dual-gate GFETs along with implementation of the residual carrier density, velocity saturation and access resistances contributing to an accurate description of the drain current. Moreover, the developed large-signal compact model incorporates an accurate description of the gate-capacitances (C-GS, C-GD) that extends the model's capabilities to AC simulations. Finally, the model has been implemented in Verilog-A and its accuracy is validated through comparison with DC and RF measurements from different GFET technologies.
引用
收藏
页码:240 / 243
页数:4
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