The sputtering yield of the MgO protective layer in AC-PDPs

被引：0

作者：

Lee, H. J. ^{[1
]}

Son, C. G. ^{[1
]}

Jung, S. H. ^{[1
]}

Han, Y. K. ^{[1
]}

Lee, S. B. ^{[1
]}

Ybo, N. L. ^{[1
]}

Lim, J. E. ^{[1
]}

Lee, J. H. ^{[1
]}

Song, K. B. ^{[1
]}

Moon, M. W. ^{[1
]}

Ko, B. D. ^{[1
]}

Oh, P. Y. ^{[1
]}

Jeong, J. M. ^{[1
]}

Jung, W. H. ^{[1
]}

Jung, K. W. ^{[1
]}

Hyun, J. W. ^{[1
]}

Kang, S. O. ^{[1
]}

Choi, E. H. ^{[1
]}

机构：

[1] Kwangwoon Univ, Dept Electrophys, Charged Particle Beam & Plasma Lab, PDP Res Ctr, Seoul 139701, South Korea

来源：

IDW/AD '05: PROCEEDINGS OF THE 12TH INTERNATIONAL DISPLAY WORKSHOPS IN CONJUNCTION WITH ASIA DISPLAY 2005, VOLS 1 AND 2 | 2005年

关键词：

D O I：

暂无

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

One of the important problems in recent AC-PDP technology, is the image sticking. The sputtering yield of MgO protective layer is related with the image sticking. In this research, we have investigated the sputtering yield of various MgO protective layers and have proposed most suitable material as protective layer. So we have measured ion induced secondary electron emission coefficient, the sputtering yield and erosion rate of MgO protective layer and have observed the surface of MgO layer As a result, we have concluded that fused poly MgO is the most stability material as protective layer of AC-PDP. Because it has higher ion induced secondary electron emission coefficient and lower sputtering yield and erosion rate. Hereafter we will have investigated its other characteristics applied at PDP test panel.

引用

页码：1523 / 1526

页数：4

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