Absolute cross sections for the photoionization of 4d electrons in Xe+ and Xe2+ ions

被引：63
|
作者：
Andersen, P [1 ]
Andersen, T
Folkmann, F
Ivanov, VK
Kjeldsen, H
West, JB
机构：
[1] Aarhus Univ, Inst Phys & Astron, DK-8000 Aarhus C, Denmark
[2] St Petersburg State Tech Univ, Dept Expt Phys, St Petersburg 195251, Russia
[3] CLRC, Daresbury Lab, Warrington WA4 4AD, Cheshire, England
来源：
JOURNAL OF PHYSICS B-ATOMIC MOLECULAR AND OPTICAL PHYSICS | 2001年 / 34卷 / 10期
关键词：
D O I：
10.1088/0953-4075/34/10/314
中图分类号：
O43 [光学];
学科分类号：
070207 ; 0803 ;
摘要：
The partial and total absolute cross sections for the photoionization of Xe+ and Xe2+ ions, respectively, have been measured in the 4d excitation region (50-130 eV). The experimental cross sections are compared with calculated values obtained by the random phase approximation method taking exchange and rearrangement into account. The maximum total cross section values are 27(3) Mb for both ions, a value also reported for the photoionization of the Xe atom. The reliability of the experimental cross sections has been tested by measuring the absolute photoionization cross section for the He+ ion.
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页码：2009 / 2019
页数：11
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