Structural damage identification for thin plates using smart piezoelectric transducers

被引：13

作者：

Tseng, KK ^{[1
]}

Wang, LS ^{[1
]}

机构：

[1] Vanderbilt Univ, Dept Civil & Environm Engn, VU Stn B 351831, Nashville, TN 37235 USA

来源：

COMPUTER METHODS IN APPLIED MECHANICS AND ENGINEERING | 2005年 / 194卷 / 27-29期

基金：

美国国家科学基金会; 美国国家航空航天局;

关键词：

damage identification; piezoelectricity; structural dynamics; impedance; finite element analysis;

D O I：

10.1016/j.cma.2004.08.007

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

An impedance-based structural damage identification method for thin plates is presented in this paper using piezoelectric ceramic (PZT) transducers. The local damages are characterized by introducing a damage parameter in each finite element. A two-dimensional electromechanical impedance model is proposed to predict the electric admittance of the PZT transducer bonded to the plates. The general equations for generating structural dynamic stiffness from normal modes are formulated based on finite element analysis. The first-order perturbation method is introduced to obtain the electric admittance change on PZT transducers due to damage. A damage identification scheme for solving nonlinear optimization problem is proposed to locate and quantify the damage by matching the numerical and experimental electric admittance change on PZT transducers. The proposed technique is verified through numerically simulated damage identification tests. (c) 2004 Elsevier B.V. All rights reserved.

引用

页码：3192 / 3209

页数：18

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