Carrier dynamics in shallow GaAs/AlGaAs quantum wells

被引:5
|
作者
Tignon, J [1 ]
Heller, O
Roussignol, P
Bastard, G
Piermarrochi, C
Planel, R
Thierry-Mieg, V
机构
[1] Ecole Normale Super, Phys Mat Condensee Lab, F-75005 Paris, France
[2] Ecole Polytech Fed Lausanne, Inst Phys Theor, CH-1015 Lausanne, Switzerland
[3] L2M CNRS, F-92225 Bagneux, France
来源
关键词
semiconductors; shallow quantum wells; photoluminescence; exciton;
D O I
10.1016/S1386-9477(98)00028-9
中图分类号
TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
We report a comprehensive study of carrier relaxation, recombination and escape mechanisms in a set of nine high-quality GaAs/AlxGa1-xAs shallow quantum wells (SQW), under various conditions of applied electric field, temperature and excitation energy, by means of time-integrated and time-resolved photoluminescence. Our experimental findings are analyzed theoretically and bring a better understanding of SQW properties as well as conventional QWs. In a biased SQW at low temperature, it is shown that photo-carrier escape via direct tunneling results in a strong quenching of the luminescence at fields one order of magnitude smaller than what prevails in conventional QWs. Apart from the field-activated escape process, we demonstrate the existence of thermally activated escape dynamics due to the low effective barrier height in SQWs. Time-resolved photoluminescence at low temperature reveals both a major increase in the relaxation times and radiative recombination times in SQWs, in good agreement with our theoretical model. (C) 1998 Elsevier Science B.V. All rights reserved.
引用
收藏
页码:126 / 130
页数:5
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