Exchange bias and fourfold magnetic anisotropy in Permalloy thin film on epitaxial hematite antiferromagnet

被引：9
|
作者：
Bali, R. [1 ]
Stelmashenko, N. A. [1 ]
Blamire, M. G. [1 ]
机构：
[1] Univ Cambridge, Dept Mat Sci & Met, Cambridge CB2 3QZ, England
来源：
JOURNAL OF APPLIED PHYSICS | 2008年 / 103卷 / 05期
关键词：
D O I：
10.1063/1.2894578
中图分类号：
O59 [应用物理学];
学科分类号：
摘要：
Fourfold anisotropy was observed in NiFe films deposited on epitaxial antiferromagnet alpha-Fe2O3. The anisotropy was preserved despite off-axis magnetic field annealing (MFA) below the Neel temperature (T-N). The cumulative effect of this fourfold anisotropy and exchange coupling due to MFA determined the exchange bias (H-ex) distribution. Physically, this indicated the existence of two types of antiferromagnet domains-those that were frozen in below T-N and contributed to the fourfold anisotropy and those that coupled with the annealing magnetic field and contributed to the conventional H-ex distribution. (c) 2008 American Institute of Physics.
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