The Exchange Bias of a Permalloy and Ordered Epitaxial IrMn Thin Film Prepared From the Growth of Ultrathin [Ir/Mn] Multilayer

被引：4

作者：

Lee, Chih-Hao ^{[1
,2
]}

Chang, Chia-Jui ^{[3
]}

Lee, Ming-Hong ^{[1
]}

Lin, Yu-Chang ^{[1
]}

Huang, J. C. A. ^{[3
]}

机构：

[1] Natl Tsing Hua Univ, Dept Engn & Syst Sci, Hsinchu 30013, Taiwan

[2] Natl Synchrotron Radiat Res Ctr, Hsinchu 30077, Taiwan

[3] Natl Cheng Kung Univ, Dept Phys, Tainan 70010, Taiwan

来源：

IEEE TRANSACTIONS ON MAGNETICS | 2011年 / 47卷 / 10期

关键词：

Exchange bias; magnetic thin films; molecular beam epitaxy; x-ray diffraction; ANISOTROPY; BILAYERS; TEMPERATURE; PHASE;

D O I：

10.1109/TMAG.2011.2160333

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

The influence of Ir(1-x)Mn(x) composition and post-annealing on structure and exchange bias of epitaxial Ir(1-x)Mn(x)(similar to 10 nm)/Ni(80)Fe(20) (7 nm) films were studied. The Ir(1-x)Mn(x) layer was prepared by MBE growth of [Mn(0.4 nm < X nm < 0.7 nm)/Ir(0.2 nm)](N) multilayer films. The optimal H(ex) increases to similar to 190 Oe after annealing at 533 K for 3 h. X-ray diffraction indicates that the strength of exchange bias is increased with the order parameter of Ir(1-x)Mn(x) alloy.

引用

页码：3497 / 3500

页数：4

共 6 条

[1] The exchange bias of a permalloy and ordered structure of epitaxial PtMn prepared from the growth of thin (Pt/Mn) multilayers
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