Angular memory effect of millimeter-wave scattering from two-dimensional conducting random rough surfaces

被引:3
|
作者
Chan, TK
Kuga, Y
Ishimaru, A
机构
[1] Department of Electrical Engineering, University of Washington, Box 352500, Seattle, 98195-2500, WA
关键词
D O I
10.1029/96RS01312
中图分类号
P1 [天文学];
学科分类号
0704 ;
摘要
An experimental study was conducted to investigate the angular memory effect of millimeter-wave scattering from two-dimensional conducting random rough surfaces. The surfaces under investigation were machine-fabricated with known Gaussian roughness statistics, and the copolarized and cross-polarized angular correlation functions (ACFs) of scattering amplitudes were measured. It was found that for the case of reference antenna positions located bistatically in a backward direction, the measured ACF exhibits broad response when single scattering dominates but two peaks when multiple scattering dominates. These observations are in good agreement with the second-order Kirchhoff approximation (KA2). Specifically, the observed broad and peak responses are analytically identified to be due to the first-order and second-order (ladder and cyclical) scattering components, respectively, in KA2.
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页码:1067 / 1076
页数:10
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