Improved assessment of the reliability of switching devices

被引：0
|
作者：
Tarantsev, AA
Dorokhin, MP
机构：
来源：
INDUSTRIAL LABORATORY | 1996年 / 62卷 / 07期
关键词：
D O I：
暂无
中图分类号：
TH7 [仪器、仪表];
学科分类号：
0804 ; 080401 ; 081102 ;
摘要：
Mathematical models describing the effects of current load and ambient temperature on the reliability of switching devices under active and inductive loads are proposed. The models provide the required agreement with experimental data and a simpler means of reliability assessment using a fairly small amount of tabular handbook data.
引用
收藏
页码：458 / 459
页数：2
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