Extraction of the frequency-dependent characteristic impedance of transmission lines using TDR measurements

被引：8

作者：

Kim, W ^{[1
]}

Swaminathan, M ^{[1
]}

Li, YL ^{[1
]}

机构：

[1] Georgia Inst Technol, Sch Elect & Comp Engn, Packaging Res Ctr, Atlanta, GA 30332 USA

来源：

PROCEEDINGS OF 3RD ELECTRONICS PACKAGING TECHNOLOGY CONFERENCE | 2000年

关键词：

D O I：

10.1109/EPTC.2000.906372

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

This paper discusses a method for measuring frequency-dependent characteristic impedance transmission lines using Time Domain Reflectometry (TDR) measurements with an open, short and load calibration. Conventional characterization methods using a network analyzer require precise information on the structure of the transmission line to extract the characteristic impedance, which can be cumbersome. In TDR measurements, the effect of the load can be removed using time windowing, which can reduce the error in the measurements. The results of TDR measurements have been compared with that of a Network Analyzer to quantify the error in the measurements. Both a lowpass filter and a PCB microstrip line have been characterized using this method.

引用

页码：191 / 197

页数：7

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